Journal Paper

Paper Title - The Effect of Thickness and Extracting Technique for Dielectric Properties


Abstract
The differences between extracting and measurement methods are presented which are used at millimeter wave frequency band (Ka and W bands), in this study. The common using measurement methods (Free Space Measurement, Waveguide, Coaxial Probe, and Resonant Cavity) are described with their features. In addition, the advantage of Newton-Raphson extracting technique is presented. Furthermore, the thickness effect is showed in process of obtaining the dielectric constant at Ka-band. Index Terms—Dielectric constant, free space measurement, genetic algorithm, newton-raphson method.


Author - Turgut Ozturk, Muhammet Tahir Guneser

Citation - Turgut Ozturk   ,   Muhammet Tahir Guneser   ,   Turgut Ozturk, Muhammet Tahir Guneser " The Effect of Thickness and Extracting Technique for Dielectric Properties " , International Journal of Industrial Electronics and Electrical Engineering , Volume-5,Issue-3  ( Mar, 2017 )

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| Published on 2017-05-31