International Journal of Industrial Electronics and Electrical Engineering(IJIEEE).
Paper Title - The Effect of Thickness and Extracting Technique for Dielectric Properties
The differences between extracting and measurement methods are presented which are used at millimeter wave
frequency band (Ka and W bands), in this study. The common using measurement methods (Free Space Measurement,
Waveguide, Coaxial Probe, and Resonant Cavity) are described with their features. In addition, the advantage of
Newton-Raphson extracting technique is presented. Furthermore, the thickness effect is showed in process of obtaining the
dielectric constant at Ka-band.
Index Terms—Dielectric constant, free space measurement, genetic algorithm, newton-raphson method.
Author - Turgut Ozturk, Muhammet Tahir Guneser
Citation - Turgut Ozturk ,
Muhammet Tahir Guneser ,
Turgut Ozturk, Muhammet Tahir Guneser " The Effect of Thickness and Extracting Technique for Dielectric Properties " ,
International Journal of Industrial Electronics and Electrical Engineering , Volume-5,Issue-3 ( Mar, 2017 )